Resumo:
In the last thirty years, progresses in nanofabrication techniques have allowed to explore electron transport inside extremely small and ‘clean’ devices. Confined in such ‘nano-devices’ electrons often reveal their true complex nature, and a rich spectrum of new phenomena emerges, with signatures of energy quantification, charge discreteness, and/or electron interferences and interactions. Characterization tools followed a similar downsizing trend, concomitant with the evolution of nanodevice fabrication. In particular, the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM) democratized nanoprobing ‘down to the atomic scale’.
In this presentation, I will give a few examples illustrating how AFM-derived techniques can give access to real-space vizualisation of electron transport phenomena in nanodevices. I will show that, imaging the electron behaviour at the nanometer scale, one can even decrypt complex quantum transport phenomena in a very direct way. The technique also opens the door towards a more “intimate” manipulation of charges and quasiparticles, which is one of the key aspects of quantum computation.
Data: 17/01/2013 às 13h
Local: Sala 210C do Instituto de Ciências Exatas - UFF - Campus Aterrado.
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